A SINGULAR CONTROL PROBLEM WITH DISCRETIONARY STOPPING FOR GEOMETRIC BROWNIAN MOTIONSMORIMOTO, Hiroaki.SIAM journal on control and optimization. 2010, Vol 48, Num 6, pp 3781-3804, issn 0363-0129, 24 p.Article

Optimal consumption models in economic growthMORIMOTO, Hiroaki.Journal of mathematical analysis and applications. 2008, Vol 337, Num 1, pp 480-492, issn 0022-247X, 13 p.Article

Variational inequalities for combined control and stoppingMORIMOTO, Hiroaki.SIAM journal on control and optimization. 2004, Vol 42, Num 2, pp 686-708, issn 0363-0129, 23 p.Article

Optimal dividend payments in the stochastic Ramsey modelMORIMOTO, Hiroaki.Stochastic processes and their applications. 2010, Vol 120, Num 4, pp 427-441, issn 0304-4149, 15 p.Article

An extension of the linear regulator for degenerate diffusionsAZIZUL BATEN, Md; MORIMOTO, Hiroaki.IEEE transactions on automatic control. 2005, Vol 50, Num 11, pp 1822-1826, issn 0018-9286, 5 p.Article

OPTIMAL CONSUMPTION IN A GROWTH MODEL WITH THE COBB-DOUGLAS PRODUCTION FUNCTIONMORIMOTO, Hiroaki; XUN YU ZHOU.SIAM journal on control and optimization. 2009, Vol 47, Num 6, pp 2991-3006, issn 0363-0129, 16 p.Article

Optimal exploitation of renewable resources by the viscosity solution methodMORIMOTO, Hiroaki; KAWAGUCHI, Kazuhito.Stochastic analysis and applications. 2002, Vol 20, Num 5, pp 927-946, issn 0736-2994, 20 p.Article

Optimal consumption of the finite time horizon Ramsey problemADACHI, Takashi; MORIMOTO, Hiroaki.Journal of mathematical analysis and applications. 2009, Vol 358, Num 1, pp 28-46, issn 0022-247X, 19 p.Article

On a variational inequality associated with a stopping game combined with a controlKAMIZONO, Kenji; MORIMOTO, Hiroaki.Stochastics and stochastics reports (Print). 2002, Vol 73, Num 1-2, pp 99-123, issn 1045-1129Article

Photomask and next-generation lithography mask technology VII (Yokohama, 12-13 April 2000)Morimoto, Hiroaki.SPIE proceedings series. 2000, isbn 0-8194-3702-6, XV, 750 p, isbn 0-8194-3702-6Conference Proceedings

EVALUATION OF EXPANSION ENERGY OF EXPANSIVE CONCRETE = Evaluation de l'énergie d'expansion de bétons expansifsOZAWA, Mitsuo; MORIMOTO, Hiroaki.Actes des journées scientifiques du LCPC. 2007, pp 1013-1018, issn 1628-4704, isbn 2-7208-2495-X, 2Vol, 6 p.Conference Paper

Reduced expression of human mismatch repair genes in adult T-cell leukemiaMORIMOTO, Hiroaki; TSUKADA, Junichi; KOMINATO, Yoshihiko et al.American journal of hematology. 2005, Vol 78, Num 2, pp 100-107, issn 0361-8609, 8 p.Article

Mask roadmap, mask Technology trend, critical issues, and activities of International SEMATECHCARPENTER, Wally.SPIE proceedings series. 2000, pp 544-551, isbn 0-8194-3702-6Conference Paper

Quality assurance and yield improvement in photomask fabricationYAMAUCHI, Takashi.SPIE proceedings series. 2000, pp 302-304, isbn 0-8194-3702-6Conference Paper

Assessing poly layer performance of UV defect detection systemsREYNOLDS, James A.SPIE proceedings series. 2000, pp 446-451, isbn 0-8194-3702-6Conference Paper

Current status of NGL masksWALKER, David M.SPIE proceedings series. 2000, pp 94-104, isbn 0-8194-3702-6Conference Paper

Characteristics of CD measurement equipmentYAMANE, Takeshi; HIRANO, Takashi.SPIE proceedings series. 2000, pp 531-536, isbn 0-8194-3702-6Conference Paper

Magnetic neutral loop discharge etching for 130 nm generation photomask fabricationKATSUMATA, Mikio; KAWAHIRA, Hiroichi.SPIE proceedings series. 2000, pp 210-217, isbn 0-8194-3702-6Conference Paper

Pellicle for F2 laser lithographySHIRASAKI, T; KASHIDA, M.SPIE proceedings series. 2000, pp 571-578, isbn 0-8194-3702-6Conference Paper

Critical defects in X-ray masks for 100 nm patternsWATANABE, H; MATSUI, Y.SPIE proceedings series. 2000, pp 131-140, isbn 0-8194-3702-6Conference Paper

Impact of MEF on 0.15-μm KrF lithographyIWASAKI, Haruo; TANABE, Hiroyoshi.SPIE proceedings series. 2000, pp 24-31, isbn 0-8194-3702-6Conference Paper

Mask Cost of Ownership for advanced lithographyMUZIO, Ed; SEIDEL, Phil.SPIE proceedings series. 2000, pp 73-83, isbn 0-8194-3702-6Conference Paper

The end of thresholds : Subwavelength optical linewidth measurement using the Flux-Area techniqueFIEKOWSKY, Peter.SPIE proceedings series. 2000, pp 537-542, isbn 0-8194-3702-6Conference Paper

Cro_xF_y as a material for attenuated phase-shift masks in ArF lithographyNAKAZAWA, Keisuke; MATSUO, Takahiro; ONODERA, Toshio et al.SPIE proceedings series. 2000, pp 682-687, isbn 0-8194-3702-6Conference Paper

Proximity effect correction for reticle fabricationSUGIYAMA, Masao; KUBO, Shinji; HIRUTA, Kouji et al.SPIE proceedings series. 2000, pp 180-187, isbn 0-8194-3702-6Conference Paper